The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Mar. 30, 2018
Applicant:

Gen-probe Incorporated, San Diego, CA (US);

Inventor:

Rolf Silbert, Del Mar, CA (US);

Assignee:

GEN-PROBE INCORPORATED, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G16H 10/40 (2018.01); G01N 35/00 (2006.01); G16H 10/65 (2018.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G16H 10/65 (2018.01); G01N 2035/00752 (2013.01); G01N 2035/00831 (2013.01); G01N 2035/00841 (2013.01); G01N 2035/00861 (2013.01); G16H 10/40 (2018.01);
Abstract

A sample receptacle can be used for ordering assays to be performed by an automatic sample processing instrument. The sample receptacle can include a body defining a chamber for containing a sample and a label. The label can include discrete areas configured to be altered from a first assay order state to a second assay order state. Each discrete area has a known association with a different assay. The label can also include assay-identifying indicia indicating the respective assay associated with a respective discrete area. A method of processing a sample in a receptacle having one or more assay order states can include automatically determining assay order states of the discrete areas and performing an assay on the sample, using the automatic sample processing instruments, based on the determined assay order states of the discrete areas.


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