The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Jun. 05, 2020
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventor:

Jennifer Samproni, Braintree, MA (US);

Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/333 (2006.01); G01N 27/30 (2006.01); G01N 27/416 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01N 27/333 (2013.01); G01N 27/301 (2013.01); G01N 27/4163 (2013.01); G01N 33/492 (2013.01);
Abstract

The inventive concepts disclosed herein are generally directed to the need to measure a microsample and obtain one or more measurement for one or more analyte in the microsample by configuring a sensor array having one or more first reference signal source interlaced with one or more analyte sensor positioned along the longitudinal axis the sensor body and a second reference signal source positioned downstream of the sensor body along a sample flow path.


Find Patent Forward Citations

Samproni, Jennifer. (2025). System and method of measurement and calibration of analyte testing (U.S. Patent No. 12320771). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12320771

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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