The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Apr. 06, 2020
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Amit Ashok, Tucson, AZ (US);

Ahmad Masoudi, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G01V 5/22 (2024.01); G01V 5/226 (2024.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01V 5/226 (2024.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01V 5/224 (2024.01);
Abstract

Methods, system and devices for multiplexed x-ray detection systems are described. The x-ray detection systems are designed using a multiplexed array of x-ray sources that are turned on simultaneously in groups of two or more x-ray sources to form multiple exposures that are detected by a plurality of detectors. The number of exposures, as well as x-ray source characteristics and parameters, such as the number and output energy level associated with each x-ray source are determined to optimize the quality of reconstrued images or maximize the detection/classification accuracy of object(s) and/or material(s) based on a total photon energy budget. The disclosed detection methods and devices improve both the quality and acquisition speed of x-ray images and x-ray measurement data for detection/classification of object(s) and/or material(s).


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