The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Dec. 22, 2022
Applicant:

Virtek Vision International Inc, Waterloo, CA;

Inventors:

Ahmed Elhossini, Waterloo, CA;

David Paul Smith, Kitchener, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 11/25 (2006.01); G01N 21/956 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/956 (2013.01); G01B 11/2518 (2013.01); G01B 11/303 (2013.01); G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A system identifying an area of interest of an inspection surface is disclosed. A controller includes a machine learning model trained using stored images defining an area of interest on the inspection surface. A laser projector for projecting laser indicia onto the inspection surface is spatially located relative to the inspection surface enabling the laser projector to project the laser indicia onto the area of interest. An imager includes an image sensor system generates a current image of the inspection surface and signals the current image to the controller. The machine learning model is directed to the area of interest of the current image as identified by the laser indicia and the machine learning model implementing the neural network to inspect the current image of the area of interest as defined by the laser indicia enabling localized inspection of the inspection surface.


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