The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

May. 13, 2021
Applicant:

Loughborough University, Leicestershire, GB;

Inventors:

Jonathan Huntley, Leicestershire, GB;

Christos Pallikarakis, Leicestershire, GB;

Pablo Ruiz, Leicestershire, GB;

Assignee:

LOUGHBOROUGH UNIVERSITY, Leicestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02004 (2022.01); G01B 9/02001 (2022.01); G01B 9/02091 (2022.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02004 (2013.01); G01B 9/02009 (2013.01); G01B 9/02091 (2013.01); G01N 21/47 (2013.01);
Abstract

An interferometry apparatus comprising: a laser source operable to emit a first light beam; a beam splitter arranged to split the first light beam into an object beam and a reference beam, the object beam passing along an object beam arm and the reference beam passing along a reference beam arm; an adaptive delay line located a distance along the reference beam arm, the adaptive delay line being configured to provide, in use, one or more length-adjusted reference beams; a beam splitter arranged to recombine the object beam from the object beam arm and the length-adjusted reference beam(s) from the reference beam arm; and a photodetector operable to detect interference between the object beam and the length-adjusted reference beam(s).


Find Patent Forward Citations

Loading…