The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Feb. 10, 2022
Applicant:

Sarcos Corp., Salt Lake City, UT (US);

Inventors:

Richard Kirby, Heber City, UT (US);

Fraser M. Smith, Salt Lake City, UT (US);

Marc X. Olivier, Salt Lake City, UT (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/27 (2006.01); G01B 11/00 (2006.01); G01B 11/16 (2006.01); G01D 5/26 (2006.01); G01L 1/24 (2006.01); G01P 3/36 (2006.01); G01P 15/093 (2006.01); G01P 15/18 (2013.01); G01P 21/00 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01B 11/272 (2013.01); G01B 11/167 (2013.01); G01L 1/24 (2013.01); G01P 3/36 (2013.01); G01P 15/18 (2013.01); G06T 7/74 (2017.01); G01B 11/002 (2013.01); G01B 11/16 (2013.01); G01D 5/26 (2013.01); G01P 15/093 (2013.01); G01P 21/00 (2013.01);
Abstract

A compact displacement sensor comprises a light intensity pattern object, a micro-lens array and an imaging device including a light-intensity measuring surface. The micro-lens array is disposed between the light intensity pattern object and the imaging device such that each micro-lens focuses a corresponding sub-image making up a portion of the light-intensity pattern on the light-intensity measuring surface to create thereupon an image of the object comprising an array of focused sub-images. The displacement sensor can provide high resolution measurements of displacement of the light intensity pattern object from a reference position by registering subsequent images captured after a change in relative position between light intensity pattern object and the imaging device to a reference image based on pattern portions in the focused sub-images.


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