The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Dec. 23, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Akinari Takagi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01B 11/25 (2006.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01B 11/2545 (2013.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/70 (2017.01); G06T 2207/10012 (2013.01);
Abstract

A measurement apparatus, comprising: a projection apparatus configured to project a predetermined pattern on a subject; and an image capturing system configured to capture a group of images from at least two different viewpoints, wherein the distance between the viewpoints is shorter than the distances between the projection apparatus and the viewpoints, the measurement apparatus further comprising: relative position calculation means for obtaining a relative position of the projection apparatus relative to at least one of the viewpoints from pattern image positions on the group of images and a positional relationship between the viewpoints, wherein distance information regarding the subject is acquired from the relative position and a pattern image position on an image at the viewpoint.


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