The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Jul. 19, 2022
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki, JP;

Inventors:

Yasunori Chiba, Yokohama, JP;

Hiromasa Takahashi, Minato, JP;

Masahiro Saito, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 19/02 (2006.01); B23K 31/12 (2006.01); B25J 9/16 (2006.01); G01N 29/04 (2006.01); G01N 29/06 (2006.01); G01N 29/11 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
B25J 19/026 (2013.01); B25J 9/1653 (2013.01); G01N 29/043 (2013.01); G01N 29/069 (2013.01); G01N 29/11 (2013.01); G01N 29/225 (2013.01); G01N 29/265 (2013.01); B23K 31/125 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/044 (2013.01); G01N 2291/106 (2013.01); G01N 2291/267 (2013.01); G05B 2219/37217 (2013.01);
Abstract

According to one embodiment, a processing system sets a detector to a prescribed position. The detector includes a plurality of detection elements arranged along a first direction and a second direction. The second direction crosses the first direction. The processing system causes the detector to perform a probe of a weld portion of a joined body. The probe includes a transmission of an ultrasonic wave and a detection of a reflected wave. The processing system calculates a center position of the weld portion in a first plane along the first and second directions based on intensity data. The intensity data is of an intensity of the reflected wave obtained by the probe. The processing system performs a position adjustment of moving the detector along the first plane to reduce a distance between the center position and a position of the detector in the first plane.


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