The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Jun. 16, 2021
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Jae Min Kang, Seoul, KR;
Yong Joo Kwon, Yongin-si, KR;
Seung Woo Noh, Seongnam-si, KR;
Sang Yun Park, Hwaseong-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/02 (2006.01); A61B 5/021 (2006.01); A61B 5/022 (2006.01); A61B 5/024 (2006.01); A61B 5/16 (2006.01); A61B 90/00 (2016.01); G06F 1/16 (2006.01); G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
A61B 5/6843 (2013.01); A61B 5/02007 (2013.01); A61B 5/02108 (2013.01); A61B 5/02116 (2013.01); A61B 5/02225 (2013.01); A61B 5/02416 (2013.01); A61B 5/165 (2013.01); A61B 5/4884 (2013.01); A61B 5/681 (2013.01); A61B 5/6824 (2013.01); A61B 5/6831 (2013.01); A61B 5/725 (2013.01); A61B 5/7278 (2013.01); A61B 5/743 (2013.01); G06F 1/163 (2013.01); G06F 3/015 (2013.01); G06F 3/017 (2013.01); A61B 5/7214 (2013.01); A61B 2090/065 (2016.02); A61B 2562/0247 (2013.01); A61B 2562/0261 (2013.01);
Abstract
An apparatus for measuring biometric information is provided. The apparatus may include: a main body configured to be worn on an object to be examined. The main body may include a contact pressure sensor configured to measure a contact pressure of the object while a hand shape is changing; a pulse wave sensor configured to measure a pulse wave signal of the object; and a processor configured to measure biometric information on the basis of the measured contact pressure and pulse wave signal.