The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Mar. 04, 2020
Applicant:

Consejo Superior DE Investigaciones Científicas, Madrid, ES;

Inventors:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/032 (2006.01); G02F 1/01 (2006.01); G02F 1/19 (2019.01);
U.S. Cl.
CPC ...
A61B 3/0325 (2013.01); G02F 1/0126 (2013.01); G02F 1/19 (2013.01);
Abstract

An apparatus for performing optometric measurements includes an opto-adjustable lens, the optical power of which is adjustable, with the lens being controlled by a periodic signal configured for producing a periodic optical power wave over time. The apparatus also includes a component for the adjustment of the mean value of the periodic optical power wave. The apparatus further includes an optical projector system for projecting a plane of the opto-adjustable lens onto a plane external to the apparatus, and in that the periodic signal has an amplitude such that it produces an amplitude of the periodic optical power wave corresponding to a chromatic difference of focus between a first wavelength and a second wavelength of visible light which passes the opto-adjustable lens. A system for the performance of optometric measurements and a method for adjusting the optical power of an adjustable lens are related to the apparatus.


Find Patent Forward Citations

Loading…