The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Mar. 14, 2023
Applicant:

Plume Design, Inc., Palo Alto, CA (US);

Inventors:

Miroslav Samardzija, Mountain View, CA (US);

Tommy Chu, Hsinchu County, TW;

Liem Hieu Dinh Vo, San Jose, CA (US);

Assignee:

PLUME DESIGN, INC., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/18 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); H04B 17/18 (2015.01); H04B 17/29 (2015.01);
Abstract

System and methods are provided for selecting reference units for calibration of OTA testing stations. Various embodiments include selecting a reference unit for over-the-air (OTA) testing, the selecting including responsive to conducting one or more tests for a plurality of test items on a plurality of units via an OTA testing station, collecting test result values for each of the plurality of test items; calculating a sum of all errors for each of the units, wherein the errors represent a deviation from an average result for each of the test items; determining a unit which exhibits a lowest sum value of all of the errors, wherein the unit is determined as a reference unit for calibrating the OTA testing station; and testing a wireless device with the reference unit.


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