The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Nov. 14, 2022
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Inwoong Kim, Allen, TX (US);

Olga I. Vassilieva, Plano, TX (US);

Paparao Palacharla, Richardson, TX (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/07 (2013.01); H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0791 (2013.01);
Abstract

In an example, a method may include a first optical signal and a second optical signal being obtained by a receiving device. The first optical signal may include a first wavelength and the second optical signal may include a second wavelength. The method may also include obtaining a determination that a dynamic anomaly may be present in the transmission medium. In response to the determination that a dynamic anomaly is present in the transmission medium, a relationship between the first optical signal and the second optical signal may be determined to obtain a time delay. The method may include using the time delay, the first wavelength, and the second wavelength to determine an anomaly location in the transmission medium.


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