The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Sep. 12, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Anja Fritzler, Erlangen, DE;

Petra Maurer, Heroldsbach, DE;

Peter Geithner, Erlangen, DE;

Christoph Jud, Nuremberg, DE;

Assignee:

SIEMENS HEALTHINEERS AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/10 (2006.01); H01J 35/14 (2006.01);
U.S. Cl.
CPC ...
H01J 35/153 (2019.05); H01J 35/10 (2013.01);
Abstract

One or more example embodiments relates to an extra-focal beam aperture device for an X-ray emitter and to the X-ray emitter. The extra-focal beam aperture device according to one or more example embodiments for an X-ray emitter has a planar beam-shaping element including an X-ray opaque material, the planar beam-shaping element being configured to form a useful X-ray beam and an X-ray measuring beam separate from the useful X-ray beam, from an X-ray beam bundle incident upon the extra-focal beam aperture device, the planar beam-shaping element including two side faces opposite each other, a radial lateral surface between the two side faces, a cross-section through the radial lateral surface having an approximately trapezoid shape, and at least one cut-out for shaping the X-ray measuring beam, the at least one cut-out having a tapering cross-section.


Find Patent Forward Citations

Loading…