The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Jun. 13, 2023
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Yeonsu Jang, Icheon-si, KR;

Woongrae Kim, Icheon-si, KR;

Jung Min Yoon, Icheon-si, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 29/42 (2006.01); G11C 29/46 (2006.01); G11C 7/04 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G11C 29/42 (2013.01); G11C 29/46 (2013.01); G11C 7/04 (2013.01); G11C 2029/4402 (2013.01); G11C 29/50 (2013.01); G11C 2029/5002 (2013.01);
Abstract

A memory device includes a sense amplifying circuit coupled between a pull-up voltage line and a pull-down voltage line and configured to sense and amplify data of bit lines according to a sensing control signal; a fail detection circuit configured to calculate counting values of fail bits for each temperature based on the data and configured to generate a minimum error code for each temperature by detecting a minimum value for each temperature from the counting values for each temperature, in response to a test mode signal; and a sense amplifying control circuit configured to drive the pull-up voltage line and the pull-down voltage line by generating a pull-up voltage and a pull-down voltage corresponding to current temperature information based on the minimum error code for each temperature and configured to generate the sensing control signal according to the test mode signal.


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