The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Oct. 24, 2022
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Chetan Sudhakar Kadway, Nagpur, IN;

Arpan Pal, Kolkata, IN;

Sounak Dey, Kolkata, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01); G06V 10/82 (2022.01); G06V 20/13 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01); G06V 10/82 (2022.01); G06V 20/13 (2022.01);
Abstract

State of art techniques rely of FPGA based approaches when power efficiency is of concern. However, compared to SNN on Neuromorphic hardware, ANN on FPGA requires higher power and longer design cycles to deploy neural network on hardware accelerators. Embodiments of the present disclosure provide a method and system for energy efficient hierarchical multi-stage SNN architecture for classification and segmentation of high-resolution images. Patch-to-patch-class classification approach is used, where the image is divided into smaller patches, and classified at first stage into multiple labels based on percentage coverage of a parameter of interest, for example, cloud coverage in satellite images. The image portion corresponding to the partially covered patches is divided into further smaller size patches, classified by a binary classifier at second level of classification. Labels across multiple SNN classifier levels are aggregated to identify segmentation map of the input image in accordance with the coverage parameter of interest.


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