The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Sep. 04, 2020
Applicant:

Nikon Corporation, Tokyo, JP;

Inventors:

Toru Ichihashi, Yokohama, JP;

Yoichi Yamazaki, Yokohama, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/17 (2006.01); G01N 33/483 (2006.01); G06T 5/70 (2024.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); G01N 21/17 (2013.01); G01N 33/4833 (2013.01); G06T 5/70 (2024.01); G06T 7/62 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract

An image analyzer including: an area setting unit configured to extract a scratch area that is an area having no cells from a reference image selected from a plurality of images acquired by imaging cells in a time series and set a reference region corresponding to the scratch area in the plurality of images; a calculation unit configured to calculate an area of a cell region within the reference region and/or the ratio of an area of the cell region to the reference region from the plurality of images; and a control unit configured to cause a display device to display a change in a time series of the calculated area of the cell region and/or the ratio of the area of the cell region to the reference region.


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