The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jul. 19, 2021
Applicant:
Deciphex, Glasnevin, IE;
Inventors:
Mark Gregson, Dublin, IE;
Hammad A. Qureshi, Dublin, IE;
Assignee:
DECIPHEX, Dublin, IE;
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/045 (2023.01); G06F 18/231 (2023.01); G06F 18/2411 (2023.01); G06N 3/08 (2023.01); G06T 7/00 (2017.01); G06V 10/50 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06F 18/231 (2023.01); G06F 18/2411 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06V 10/50 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 20/698 (2022.01);
Abstract
Systems and methods are provided for generating clusters of anomalous images. Histopathological samples are images at an associated imaging system to produce a plurality of images. A plurality of anomalous images are identified from the plurality of images at an anomaly detection system, having an associated latent space. The plurality of anomalous images are clustered to generate a plurality of clusters within a feature space defined by a set of classification features. The set of classification features include a feature derived from the latent space associated with the anomaly detection system.