The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jul. 07, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Wan-Jhen Lee, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for detecting defects in appearance of a product from images thereof, applied in an electronic device, obtains positive sample images, negative sample images, and product sample images, divides the product sample images into input image blocks, and inputs the input image blocks into a pre-trained autoencoder to obtain reconstructed image blocks. The electronic device determines corresponding pixel points in the input image blocks, and corresponding pixel difference values, and generates feature connection regions of each input image block according to the positive sample images and the pixel difference values. The electronic device generates a first threshold, selects target regions from the feature connection regions and the first threshold, and generates a second threshold. The electronic device further determines a detection result of a product sample in the product sample image according to an area of the target area and the second threshold.