The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
May. 18, 2021
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Yoshinori Itai, Tokyo, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 9/4401 (2018.01); G06N 20/00 (2019.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 40/20 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06T 7/00 (2013.01); G06F 9/4401 (2013.01); G06N 20/00 (2019.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G06T 2207/20081 (2013.01); G16H 40/20 (2018.01); G16H 50/20 (2018.01);
Abstract
The image analysis device includes an analysis unit that analyzes input image data using a preset analysis function, and a control unit that, in a case in which a start-up request is received from an exterior, determines an analysis function to be a start-up target among plural analysis functions based on an analysis result obtained by the preset analysis function and a preset condition, and performs control to start-up the determined analysis function.
Quick Actions:
Itai, Yoshinori. (2025). Image analysis device, analysis function decision method, and analysis function decision program (U.S. Patent No. 12315123). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12315123
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile