The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

May. 23, 2022
Applicant:

Dell Products, L.p., Round Rock, TX (US);

Inventors:

Loo Shing Tan, Singapore, SG;

Seng Khoon Teh, Singapore, SG;

Assignee:

Dell Products, L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 17/20 (2006.01); G06V 10/762 (2022.01); G06V 10/766 (2022.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06V 10/762 (2022.01); G06V 10/766 (2022.01); G06V 40/161 (2022.01); G06V 40/171 (2022.01); G06V 40/172 (2022.01);
Abstract

Methods and systems are provided for determining a posture of a user of an Information Handling System (IHS). One or more cameras of the IHS are utilized to generate a two-dimensional image of the user as they operate the IHS. Landmarks that correspond to physical features of the user are identified through processing of the two-dimensional image generated using the cameras. The system then identifies, from a database comprising a plurality of differing wireframes, a subset of the wireframes that optimally match the physical feature landmarks of the user, each of the wireframes associated with an ergonomic level, and performs a regression analysis technique on the ergonomic level of each of the subset of wireframes to determine a posture score of the user.


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