The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Jan. 29, 2020
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Min Hyuk Kim, Daejeon, KR;

Daniel Jeon, Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01); G02B 27/42 (2006.01); G06N 3/08 (2023.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/001 (2013.01); G01J 3/18 (2013.01); G01J 3/2823 (2013.01); G02B 27/4205 (2013.01); G06N 3/08 (2013.01); G01J 2003/2826 (2013.01);
Abstract

Disclosed are a hyperspectral imaging method and an apparatus thereof. A method of reconstructing a hyperspectral image includes receiving an image photographed through a diffractive optical element and reconstructing a hyperspectral image of the received image based on the received image and information about a point spread function for each wavelength of the diffractive optical element. The diffractive optical element may generate an anisotropic shape of the point spread function that varies with a spectrum.


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