The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Apr. 19, 2024
Applicant:

Zhejiang University, Hangzhou, CN;

Inventors:

Xin Zhang, Hangzhou, CN;

Xueqi Liu, Hangzhou, CN;

Hao Ma, Hangzhou, CN;

Assignee:

ZHEJIANG UNIVERSITY, Hangzhou, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/0464 (2023.01); G01R 31/40 (2020.01); G01R 31/54 (2020.01);
U.S. Cl.
CPC ...
G06N 3/0464 (2023.01); G01R 31/40 (2013.01); G01R 31/54 (2020.01);
Abstract

Disclosed is a fault diagnosis method for a four-switch Buck-Boost converter, including the following steps: obtaining circuit parameters when different faults occur, labeling fault parameters with fault types, and combining the fault parameters and labels into a data set; constructing a simplified self-organizing neural network consisting of a plurality of nonlinear operation modules, a weighting module, and an analysis module; performing training by using the data set to obtain a self-organizing neural network for determining the faults of the converter; and inputting the circuit parameters of the four-switch Buck-Boost converter to the self-organizing neural network, so as to determine the fault types of the four-switch Buck-Boost converter. Further disclosed is a fault diagnosis apparatus for a four-switch Buck-Boost converter. The method provided by the present invention is capable of simultaneously identifying and locating the faults of the four-switch Buck-Boost converter, such as an open circuit fault of a switching tube, aging of a capacitor, and aging of an inductor, and has good diagnosis accuracy and generalization capability.


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