The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Nov. 19, 2021
Applicant:

Veeva Systems Inc., Pleasanton, CA (US);

Inventors:

Asaf Roll, Richmond Hill, CA;

Ying Zhuo Wang, Toronto, CA;

Florian Emmanuel Bernard Gilbert Letourneux, Rennes, FR;

Zhen Tan, North York, CA;

Piotr Kuchnio, Toronto, CA;

Assignee:

Veeva Systems Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 40/58 (2020.01);
U.S. Cl.
CPC ...
G06F 40/58 (2020.01);
Abstract

A method for generating a first case dataset in a first language. The method includes receiving adverse event data. The method further includes determining case data including general case data and regional case data and providing the case data to a translator computing device to enable display on a user interface including multiple duolingual text fields with a first language text field including at least a portion of the text data in the first language and a second language text field adjacent the first language text field. The method further includes receiving the text data in the second language from a translator computing device. The text data in the second language is received via the second language text fields of the plurality of duolingual text fields. The method further includes generating and outputting the first case dataset including the text data in the first language.


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