The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Nov. 21, 2019
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Ashwin Jayaprakash, Sunnyvale, CA (US);

Juhwan Jeong, San Fancisco, CA (US);

Ryan Nicholas TerBush, Laguna Hill, CA (US);

Vinay Srinivasaiah, San Carlos, CA (US);

Puneet Anand, Saratoga, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/62 (2013.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 21/6245 (2013.01); G06F 11/302 (2013.01); G06F 11/3466 (2013.01);
Abstract

In one embodiment, a method for automatic application data collection is disclosed. The method illustratively comprises determining a stack trace associated with one or more business transactions, wherein at least one application is configured to perform at least part of the one or more business transactions; identifying, based on the stack trace, one or more methods of the at least one application that were invoked during performance of the one or more business transactions; selecting, from the identified one or more methods, a set of the one or more methods by applying at least one scoring heuristic to the identified one or methods; and configuring one or more monitoring agents executing on the at least one application to instrument the selected set of the one or methods at one or more instrumentation points, wherein application performance data is generated by instrumentation of the one or more instrumentation points.


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