The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Sep. 27, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ryo Mizushima, Tokyo, JP;

Hirofumi Ueda, Tokyo, JP;

Tomohiko Yagyu, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

Attack path information includes information about an attack path including at least one attack step including an attack source, an attack destination, and an attack method. Vulnerability specification means refers to the attack path information and thereby specifies vulnerabilities exploitable by an attack on the attack destination in the attack step. In the vulnerability information DB, vulnerabilities and presence/absence of exploit codes for the vulnerabilities are stored and associated with each other. Diagnosis evaluation generation means refers to the vulnerability information DB, and thereby examines whether or not there is an exploit code for the specified vulnerability and generates, for the attack step, a risk diagnosis evaluation including the number of specified vulnerabilities and the presence/absence of the exploit codes therefor. Output means outputs the attack step and the risk diagnosis evaluation while associating them with each other.


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