The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Dec. 20, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Deepak Keshwani, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 6/00 (2024.01); G01T 1/29 (2006.01); G06F 18/214 (2023.01); G06F 18/2431 (2023.01); G06N 3/045 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06F 18/2148 (2023.01); G06F 18/2431 (2023.01); G06N 3/045 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); A61B 6/5205 (2013.01); G01T 1/2985 (2013.01); G06V 2201/03 (2022.01);
Abstract

A first learning unit performs learning of a first neural network that extracts a feature vector in each pixel of a target image including a plurality of objects and that outputs a feature map in which feature vectors of pixels belonging to individual objects included in the target image are clustered and distributed as a plurality of the feature vector groups in a feature space which is a space of the feature vector. A second learning unit performs learning of a second neural network that outputs a class classification result of a plurality of objects belonging to the same category included in the target image in response to input of the feature vector of the target image.


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