The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jun. 26, 2024
Normalyze, Inc., Los Altos, CA (US);
Yang Zhang, Fremont, CA (US);
Ajay Agrawal, Bangalore, IN;
Ravishankar Ganesh Ithal, Los Altos, CA (US);
Normalyze, Inc., Los Altos, CA (US);
Abstract
The disclosed technology receives a control input identifying a sampling criterion for classifying a data store storing a set of data objects in a computing environment as corresponding to a target data type and deploys one or more scanners configured to select a representative subset of data objects, from the set of data objects, based on the sampling criterion. A scanner result generated by the one or more scanners is received that represents detected instances, in the representative subset of data objects, of one or more pre-defined data patterns of the target data type. A classification result is generated based on a comparison of the number of detected instances of the one or more pre-defined data patterns to a threshold. The classification result represents a classification of the data store as having correspondence to the target data type. A computing action is performed based on the classification result.