The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Jul. 20, 2023
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Manu Kurian, Dallas, TX (US);

Ana Maxim, Arlington, VA (US);

Vinesh Patel, London, GB;

Michael Young, Davidson, NC (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G16H 20/70 (2018.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G16H 20/70 (2018.01);
Abstract

Systems and methods for an artificial intelligence-based auditor of artificial intelligence may be provided. The artificial-intelligence-based auditor may operate on one or more hardware processors. The artificial intelligence-based auditor may continually scan one or more operating artificial intelligence systems for productivity and operability. The scan may identify a data source powering the one or more operating artificial intelligence systems. The scan may measure a delta between an output from each of the one or more operating artificial intelligence systems. The scan may identify trends in quality of the one or more operating artificial intelligence systems. The scan may analyze instances where the one or more operating artificial intelligence systems outputted data outside of a parameter range. Based on the scan, the auditor may label each of the one or more operating artificial intelligence systems as positive, neutral or negative.


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