The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jul. 27, 2023
Walmart Apollo, Llc, Bentonville, AR (US);
Manjunath Channappagoudar, Bangalore, IN;
Arvind Shyam Verma, Bengaluru, IN;
Mohit Choudhary, Bentonville, AR (US);
Jingying Zhang, Beaumont, TX (US);
Juan Gomez, Bentonville, AR (US);
Lokesh Kumar Sambasivan, Tirupati, IN;
Walmart Apollo, LLC, Bentonville, AR (US);
Abstract
Systems and methods of anomaly detection in time-series are disclosed. A time-series dataset is received and a set of segments is iteratively defined from the time-series dataset by identifying a set of changepoints in the time-series dataset based on a changepoint type and a sensitivity parameter, determining whether the set of segments defined by the changepoints satisfy at least one threshold criteria, and modifying the sensitivity parameter when the threshold criteria is not met or outputting the set of segments when the threshold criteria is met. A segment-specific anomaly detection threshold is determined for each segment in the set of segments and a set of anomaly-flagged segments is generated. The set of anomaly flagged segments are generated by an anomaly detection process based on the segment-specific anomaly detection threshold for a corresponding segment. An anomaly-flagged time-series is generated by combining the set of anomaly-flagged segments.