The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Apr. 28, 2023
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Cahit Bagdelen, Walldorf, DE;

Atreju Tauschinsky, Walldorf, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); G05B 23/0224 (2013.01); G06F 18/214 (2023.01); G06F 18/217 (2023.01);
Abstract

The present disclosure relates to computer-implemented methods, software, and systems for predicting failure event occurrence for a machine asset. Run-to-failure sequences of time series data that include an occurrence of a failure event for the machine asset are received. One or more candidate cut-off values are determined based on iterative evaluation of a plurality of potential cut-off points. A candidate cut-off value is identified as substantially corresponding to a local peak point for calculated distances between relative frequency distributions of positive and negative sub-sequences. A failure prediction model is iteratively trained to iteratively extract sets of relevant features to determine a prediction horizon for an occurrence of the failure event for the machine asset. A candidate cut-off value associated with a model of highest quality from a set of failure prediction models determined during the iterations is selected to determine the prediction horizon for the machine asset.


Find Patent Forward Citations

Bagdelen, Cahit. (2025). Learning method and system for determining prediction horizon for machinery (U.S. Patent No. 12314047). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12314047

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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