The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Aug. 05, 2020
Leica Microsystems Cms Gmbh, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for automatically ascertaining illumination brightnesses to be adjusted of at least two light sources for exciting at least one respective fluorophore in a sample to be imaged in a fluorescence microscope includes separately controlling, in terms of illumination brightness, each of the at least two light sources, detecting an image intensity of a microscopically imaged sample with at least two detectors, and automatically ascertaining the illumination brightnesses to be adjusted of the at least two light sources in such a way that a predefined setpoint of a signal-to-noise ratio is reached for each fluorophore. In order to ascertain the illumination brightnesses of the at least two light sources, cross-talk of a detector for different emission spectra of the fluorophores and/or cross-excitation of a fluorophore for different illumination spectra of the light sources are/is taken into account.