The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Sep. 07, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Ke-Yu Chen, San Ramon, CA (US);

James T. Curran, Cupertino, CA (US);

Jun Gong, Hanover, NH (US);

Gierad Laput, Pittsburgh, PA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/41 (2006.01); G01S 13/42 (2006.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
G01S 7/412 (2013.01); G01S 13/42 (2013.01); G01S 13/89 (2013.01);
Abstract

Embodiments described herein provide techniques to enable spatial sensor data from multiple devices to be fused into a single coordinate space. This fused sensor data can then be processed into a point cloud. Point cloud data can then be transformed to enable the classification of objects detected within the sensor data. Features within multiple feature spaces can be extracted from the point cloud data for use in classification. Classification of objects can also be used to correlate objects detected by multiple sensor equipped devices to determine a coordinate space transformation between those devices.


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