The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Dec. 20, 2019
Fujifilm Corporation, Tokyo, JP;
Kenta Sakuragi, Tokyo, JP;
Shinji Takahashi, Tokyo, JP;
Kentaroh Sunaga, Tokyo, JP;
Chikako Moriwake, Tokyo, JP;
Hisako Nagao, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Automatically performing a serial examination flow including, for example, positioning, imaging, and post processing enables reducing a burden placed on the user by a manual operation and improving examination efficiency. A magnetic resonance imaging apparatus includes a computation unit that performs action control of the entire apparatus and computation and an imaging unit that performs imaging according to control performed by the computation unit, wherein the computation unit includes a storage unit that stores a plurality of examination flow data each defining a processing flow of at least one of imaging processing, post processing, display processing, and transfer processing, and stores a plurality of keywords respectively indicating contents of at least a part of the examination flow data, an input unit that receives an input instruction issued by a user for executing a desired examination, and an examination flow control unit that selects the examination flow data corresponding to the input instruction and causes processing defined by the selected examination flow data to be performed.