The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Jan. 17, 2023
Applicant:

Quanta Computer Inc., Taoyuan, TW;

Inventors:

Kuo-Chan Hsu, Taoyuan, TW;

Yun-Teng Shih, Taoyuan, TW;

Chia-Wei Lee, Taoyuan, TW;

Assignee:

QUANTA COMPUTER INC., Taoyuan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2020.01); G01R 31/319 (2006.01); G01R 31/3193 (2006.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01); G01R 31/31924 (2013.01); G01R 31/31932 (2013.01);
Abstract

A test load circuit includes a test load, a current sensor, and comparator. The test load is connected to a voltage source of a power supply. The current sensor is configured to detect the amount of current flowing through the test load. The comparator has a first input connected to a feedback signal having a voltage associated with the test load current, a second input connected to a command signal having has a voltage associated with a target current through the test load, and an output connected to the test load. The output of the comparator has a voltage that is based on the current difference between the target current and the test load current. The test load has a variable resistance that is controllable by the output of the comparator to adjust the test load current and cause the test load current to match the target current.


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