The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Aug. 12, 2019
Texas Instruments Incorporated, Dallas, TX (US);
Lakshmanan Balasubramanian, Bengaluru, IN;
Nadeem Husain Tehsildar, Bengaluru, IN;
Rubin Ajit Parekhji, Bengaluru, IN;
Suresh Mallala, Hyderbad, IN;
Nitin Agarwal, Bengaluru, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
In one embodiment, a method of operating a computational system to evaluate a device under test, where the device under test is operable to receive a digital code input and output in response a corresponding output. The method injects a plurality of simulated faults into a pre-silicon model of the device under test. For each injected simulated fault, the method inputs a plurality of digital codes to the model. For each input digital code, the method selectively stores the input digital code if a difference, between a corresponding output for the input digital code and a no-fault output for the input, exceeds a predetermined threshold value.