The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Sep. 13, 2023
Hynetek Semiconductor Co., Ltd., Shenzhen, CN;
Renjian Xie, Shenzhen, CN;
Yingyang Ou, Shenzhen, CN;
Hynetek Semiconductor Co., Ltd., Shenzhen, CN;
Abstract
An fault detection circuit includes a first comparison unit, a second comparison unit, an impedance unit and a digital control unit, the first comparison unit is configured to output a first judgment signal based on the voltage across a sampling resistor; the second comparison unit is configured to output a second judgment signal based on the voltage across the impedance unit, or the second comparison unit is configured to output a second judgment signal based on the voltage across the circuit in which the sampling resistor is connected in series with the impedance unit, and the digital control unit is configured to determine the working state of the sampling resistor based on the first judgment signal and the second judgment signal. Through the above method, the accuracy of overcurrent protection can be improved under the condition where the sampling resistor fails.