The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Jul. 05, 2021
Applicant:

The University Court of the University of Glasgow, Glasgow, GB;

Inventors:

Thomas McMullen, Glasgow, GB;

Richard Bates, Glasgow, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); C23F 4/00 (2006.01); G01R 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06744 (2013.01); C23F 4/00 (2013.01); G01R 1/06755 (2013.01); G01R 3/00 (2013.01);
Abstract

The present invention relates primarily to a method of fabrication of one or more free-standing micromachined parts. The method includes performing reactive ion etching of photoresist and tungsten-based layers supported on a carrier substrate to thereby define one or more micromachined parts, followed by separating the resulting one or more micromachined parts from the carrier substrate such that the parts are free-standing. The invention also relates to tungsten-based microprobe obtainable by such a method, wherein the microprobe has a substantially square or rectangular cross-section in a direction perpendicular to a longitudinal axis of the microprobe, and to probe cards comprising a plurality of such microprobes.


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