The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Oct. 09, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Masaru Miyazaki, Tokyo, JP;

Takamichi Mori, Tokyo, JP;

Assignee:
Attorney:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); B01L 9/06 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); B01L 9/06 (2013.01); G01N 35/1002 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/0405 (2013.01);
Abstract

The present invention is provided with: a sample rack body in which test tubes are inserted from insertion openings; a plurality of leaf springs that are provided to the sample rack body and press and hold the test tubes; and adaptors inserted from the insertion openings. The adaptors respectively have cylindrical bodies inserted from the insertion openings. The cylindrical bodies each have formed therein notch sections which cause the corresponding leaf spring to pass through a portion at which the leaf spring is in contact with the test tube and cause the test tube having a small outer diameter than the insertion opening to be held by the leaf spring.


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