The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jun. 01, 2022
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Tomohiro Matsuda, Toyota, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
Abstract
An inspection device includes: a first acquisition unit for acquiring a first defect probability calculated using a first learning model from data regarding an inspection target processed in a first manufacturing process; a second acquisition unit for acquiring a second defect probability calculated using a second learning model from data regarding the inspection target processed in a second manufacturing process after the first manufacturing process; and a determination unit for determining a defect in the inspection target if the acquired second defect probability is greater than or equal to a second threshold value, the determination unit being configured to change at least one of the second learning model and the second threshold value into a condition for enhancing inspection accuracy if the acquired first defect probability is greater than a predetermined first threshold, compared to if the first defect probability is less than or equal to the first threshold value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile