The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

May. 20, 2024
Applicant:

Rtx Corporation, Farmington, CT (US);

Inventors:

Jose-Rodrigo Castillo-Garza, West Hartford, CT (US);

David L. Lincoln, Cromwell, CT (US);

Assignee:

RTX Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 15/10 (2024.01); G02B 6/38 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 15/10 (2013.01); G02B 6/3885 (2013.01); G01N 2015/1027 (2024.01); G01N 2201/06113 (2013.01);
Abstract

A method of foreign object debris discrimination includes illuminating a particle located within a sensing volume with a modulated electromagnetic radiation pulse emitted from a source; receiving one or more electromagnetic radiation return signals that have been scattered by the particle illuminated by the modulated electromagnetic radiation pulse at a detector; mixing, using a controller, the electromagnetic radiation return signal of amplitude Iand frequency fwith a reference signal of amplitude Iand frequency f; analyzing, using the controller, an amplitude of the mixed signal √{square root over (II)}, and frequency of the mixed signal, f−f; and classifying, using the controller, a particle position, a velocity, and electromagnetic characteristic of the particle based on the amplitude, √{square root over (II)}, and frequency, f−f, of the mixed signal.


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