The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Dec. 16, 2020
Applicant:
Pavonis Diagnostics Inc., Edmonton, CA;
Inventors:
Matthew R. Nickel, Leduc, CA;
Hillary M. Sweet, Leduc, CA;
Assignee:
PAVONIS DIAGNOSTICS INC., Edmonton, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/78 (2006.01); A61B 5/00 (2006.01); C25D 11/02 (2006.01); C25D 11/08 (2006.01); C25D 11/10 (2006.01); C25D 11/22 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01N 21/78 (2013.01); A61B 5/0059 (2013.01); C25D 11/022 (2013.01); C25D 11/08 (2013.01); C25D 11/10 (2013.01); C25D 11/22 (2013.01); G01N 21/45 (2013.01);
Abstract
An improved thin film optical interference apparatus, methods of use and of manufacture are provided, the apparatus comprising means for generating optical interference colours directly on the surface of a single layer of anodized metal. The interference colours generated by the presently improved apparatus can be used to indicate the presence of at least one organic compound or analyte.