The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Mar. 17, 2021
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Tomohiko Hayakawa, Tokyo, JP;

Haruka Ikeda, Tokyo, JP;

Norimasa Kishi, Tokyo, JP;

Masatoshi Ishikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 21/6408 (2013.01);
Abstract

There are provided a state determination device, a state determination method, and a state determination program capable of determining a state of an object to be inspected. A state determination deviceincludes an irradiation unitwhich irradiates an object to be inspected with excitation light under a predetermined irradiation condition, a measurement unitwhich measures light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light, and a determination unitwhich determines a state of the object to be inspected by checking the light emission data against light emission data of light emission from the object to be inspected, which is measured in the case where the excitation light is emitted under an irradiation condition common to the light emission data for each state of a substance constituting the object to be inspected.


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