The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Jan. 28, 2021
Applicant:

Daylight Solutions, Inc., San Diego, CA (US);

Inventors:

H. T. Stinson, San Diego, CA (US);

Rudy Bermudez, San Diego, CA (US);

Mark Bermal, San Diego, CA (US);

Jeremy Rowlette, Escondido, CA (US);

David Francis Arnone, Mountain View, CA (US);

Edeline Fotheringham, San Diego, CA (US);

Ronald Arp, Ramona, CA (US);

Assignee:

Daylight Solutions, Inc., San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/39 (2006.01); G01N 21/27 (2006.01); G01N 29/30 (2006.01); G01N 30/74 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/276 (2013.01); G01N 21/39 (2013.01); G01N 29/30 (2013.01); G01N 30/74 (2013.01); G01N 2030/027 (2013.01);
Abstract

A fluid analyzer () that analyzes a sample () includes an analyzer frame (); a test cell assembly () that receives the sample (); a laser assembly () that generates a laser beam (A) a signal detector assembly () and a self-check assembly (). The self-check assembly () includes (i) a check frame (A); (ii) a check substance (E) with known spectral characteristics; and (iii) a check frame mover (B) that selectively moves the check frame (A) between a self-check position (B) and a test position (A) relative to the analyzer frame (). In the self-check position (B), the laser beam (A) is directed through the check substance (E) to evaluate the performance of the fluid analyzer (). In the test position (A), the laser beam (A) is directed through the sample () in the test cell assembly () to evaluate the sample ().


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