The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Apr. 14, 2021
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Atsushi Nakamura, Musashino, JP;

Yusuke Koshikiya, Musashino, JP;

Nazuki Honda, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/332 (2013.01);
Abstract

The present invention has an object to provide a mode field diameter measurement method enabling easily measuring a mode field diameter in an optical fiber, which is capable of propagating a fundamental mode (LP01 mode) and a first higher order mode (LP11 mode), without using a mode multiplexer, and a measurement device of the mode field diameter measurement method. In a mode field diameter measurement method according to the present invention, an intensity ratio between an LP01 mode and an LP11 mode output from an optical fiber to be tested is changed, a mode field diameter is measured by a variable aperture (VA) method for each intensity ratio, and each mode field diameter is calculated.


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