The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Oct. 01, 2019
Carl Zeiss Meditec Ag, Jena, DE;
Rainer Leitgeb, Vienna, AT;
Michael Niederleithner, Vienna, AT;
Carl Zeiss Meditec LLP, Jena, DE;
Abstract
A method for compensating the artifacts generated by moving measurement objects in measurement signals of swept-source OCT systems by moving measurement objects. Signal reconstruction is implemented without the aid of additional reference signals in respect of the movement of the measurement object and only by way of especially adapted algorithms. Example methods relate firstly to the especially adapted, Fourier transform-based algorithms for processing the captured measurement signals and secondly to the measurement signals to be captured, in particular to the optical coherence interferometry-based measurement systems used for the production thereof. Although the proposed method is provided for applications in ophthalmology in particular, it can be used, in principle, wherever signals reflected by curved surfaces or backscattered from structures are analyzed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile