The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Apr. 29, 2022
Applicant:

Vdeh-betriebsforschungsinstitut Gmbh, Düsseldorf, DE;

Inventors:

Julian Kremeyer, Hilden, DE;

Gert Mücke, Hilden, DE;

Marcus Neuer, Düsseldorf, DE;

Hagen Krambeer, Jüchen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21B 38/02 (2006.01); B21B 38/08 (2006.01);
U.S. Cl.
CPC ...
B21B 38/02 (2013.01); B21B 38/08 (2013.01);
Abstract

A measuring roller for determining a property of a strip-shaped material such as metal strip, passed over a measuring roller, having a measuring roller body with a circumferential surface, at least one recess in the measuring roller body, which is arranged at a distance from the circumferential surface or leads from the circumferential surface into the interior of the measuring roller body, and with a first force sensor arranged in the recess and a second force sensor arranged in the recess or in a further recess adjacent to the recess, wherein the first force sensor has a sensor surface and the first force sensor can generate a sensor signal when the position of the sensor surface of the first force sensor changes, and the second force sensor has a sensor surface and the second force sensor can generate a sensor signal when the position of the sensor surface of the second force sensor changes.


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