The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Oct. 05, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Takeshi Noda, Kanagawa, JP;
Katsuro Takenaka, Saitama, JP;
Haruki Iwai, Tochigi, JP;
Daisuke Sato, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An X-ray image processing apparatus comprising: a first obtaining unit configured to obtain a first X-ray image including an object; a second obtaining unit configured to obtain a first measured value associated with an X-ray condition of the first X-ray image, a second X-ray image that does not include the object, and a second measured value associated with an X-ray condition of the second X-ray image; a gain correction unit configured to correct the first X-ray image based on the first measured value, the second X-ray image, and the second measured value; and an image generation unit configured to generate an evaluation image for evaluating a state of the object based on a corrected image that is the first X-ray image corrected by the gain correction unit.