The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Mar. 26, 2020
Hoya Lens Thailand Ltd., Pathumthani, TH;
Nagisa Ishihara, Tokyo, JP;
Eiichiro Yamaguchi, Tokyo, JP;
Ayumu Ito, Tokyo, JP;
Toshiaki Sonehara, Tokyo, JP;
HOYA LENS THAILAND LTD., Pathumthani, TH;
Abstract
A measuring method for measuring rotation characteristics of an eyeball of a subject includes: showing display information on a display screen, at a position separated from a reference position, the display screen being shown in front of the eyeball of the subject by a display device that is secured to a head of the subject, the reference position being where a front line of sight of the eyeball of the subject who looks forward straightly, crosses the display screen; changing a direction of a line of sight from the eyeball to the display information by switching the display information to other contents while changing a displayed position of the display information; and judging whether the subject can recognize the contents of the display information at the changed position, to measure the rotation characteristics of the eyeball.