The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Sep. 24, 2021
Apple Inc., Cupertino, CA (US);
Jie Cui, San Jose, CA (US);
Dawei Zhang, Saratoga, CA (US);
Haitong Sun, Cupertino, CA (US);
Hong He, San Jose, CA (US);
Huaning Niu, San Jose, CA (US);
Manasa Raghavan, Sunnyvale, CA (US);
Qiming Li, Beijing, CN;
Xiang Chen, Campbell, CA (US);
Yang Tang, San Jose, CA (US);
Yushu Zhang, Beijing, CN;
APPLE INC., Cupertino, CA (US);
Abstract
The present disclosure is related to indication of simultaneous RX beams capability and related measurement resource coordination. In an embodiment, a UE is configured to receive, from a base station, a measurement configuration comprising a measurement period for performing measurements on one or more carriers. The UE is further configured to assign measurement resources to the one or more carriers based on a simultaneous RX beams capability, wherein the measurement resources comprise searchers and RX beams during each measurement occasion. The UE is further configured to determine a measurement period scaling factor for the one or more carriers based on the assigned resources. With this capability, the UE can complete L1 and/or L3 measurements and transmit a measurement report to the base station earlier.