The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Nov. 29, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seongkwan Lee, Suwon-si, KR;

Minho Kang, Suwon-si, KR;

Cheolmin Park, Suwon-si, KR;

Hyungsun Ryu, Suwon-si, KR;

Jaemoo Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 25/76 (2023.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 25/76 (2023.01);
Abstract

An image sensor test system includes a test device configured to transmit an input signal and a control signal to at least one image sensor through a probe card, and an interface board configured to map the probe card and the test device to each other. The interface board includes a signal receiver configured to receive an image signal from the at least one image sensor, amplify the image signal, and output the image signal to the test device, and the signal receiver includes an operational amplifier configured to amplify the image signal, and a low-frequency attenuator connected to an output terminal of the operational amplifier.


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